제조업체 | 부품명 | 데이터시트 | 상세설명 |
Silicon Laboratories |
EFM32TG110F32-D-QFN24
|
2Mb/202P
|
EFM32 Gecko Family
Rev. 2.11
|
EFM32TG110F32-QFN24
|
2Mb/65P
|
Output state retention and wake-up from Shutoff Mode
|
EFM32TG110F32-QFN24
|
265Kb/2P
|
Updated specifications based on the results of additional silicon characterization.
|
EFM32TG110F32-QFN24
|
328Kb/3P
|
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F32-QFN24T
|
328Kb/3P
|
Updated specifications based on the results of additional silicon characterization
|
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Silicon Laboratories |
EFM32TG110F32-D-QFN24
|
2Mb/202P |
EFM32 Gecko Family
Rev. 2.11 |
EFM32TG110F32-QFN24
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F32-QFN24
|
265Kb/2P |
Updated specifications based on the results of additional silicon characterization.
|
EFM32TG110F32-QFN24
|
2Mb/65P |
Output state retention and wake-up from Shutoff Mode
|
EFM32TG110F32-QFN24T
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F16-D-QFN24
|
2Mb/202P |
EFM32 Gecko Family
Rev. 2.11 |
EFM32TG110F16-QFN24
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F16-QFN24
|
265Kb/2P |
Updated specifications based on the results of additional silicon characterization.
|
EFM32TG110F16-QFN24
|
2Mb/65P |
Output state retention and wake-up from Shutoff Mode
|
EFM32TG110F16-QFN24T
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F4-D-QFN24
|
2Mb/202P |
EFM32 Gecko Family
Rev. 2.11 |
EFM32TG110F4-QFN24
|
2Mb/65P |
Output state retention and wake-up from Shutoff Mode
|
EFM32TG110F4-QFN24
|
265Kb/2P |
Updated specifications based on the results of additional silicon characterization.
|
EFM32TG110F4-QFN24
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|
EFM32TG110F4-QFN24T
|
328Kb/3P |
Updated specifications based on the results of additional silicon characterization
|