제조업체 | 부품명 | 데이터시트 | 상세설명 |
Texas Instruments |
SN74BCT8374A
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374A
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADW
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADW
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWE4
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWE4
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWG4
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWR
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWR
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWRE4
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWRE4
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ADWRG4
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ANT
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ANT
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ANTE4
|
474Kb/26P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN74BCT8374ANTE4
|
644Kb/28P
|
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|