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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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PIC18F4520E/MLQTP 데이터시트(PDF) 337 Page - Microchip Technology |
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PIC18F4520E/MLQTP 데이터시트(HTML) 337 Page - Microchip Technology |
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337 / 390 page  2004 Microchip Technology Inc. Preliminary DS39631A-page 335 PIC18F2420/2520/4420/4520 26.3 DC Characteristics: PIC18F2420/2520/4420/4520 (Industrial) PIC18LF2420/2520/4420/4520 (Industrial) DC CHARACTERISTICS Standard Operating Conditions (unless otherwise stated) Operating temperature -40°C ≤ TA ≤ +85°C for industrial Param No. Symbol Characteristic Min Max Units Conditions VIL Input Low Voltage I/O ports: D030 with TTL buffer VSS 0.15 VDD VVDD < 4.5V D030A — 0.8 V 4.5V ≤ VDD ≤ 5.5V D031 with Schmitt Trigger buffer RC3 and RC4 VSS VSS 0.2 VDD 0.3 VDD V V D032 MCLR VSS 0.2 VDD V D033 OSC1 VSS 0.3 VDD V HS, HSPLL modes D033A D033B D034 OSC1 OSC1 T13CKI VSS VSS VSS 0.2 VDD 0.3 VDD 0.3 VDD V V V RC, EC modes(1) XT, LP modes VIH Input High Voltage I/O ports: D040 with TTL buffer 0.25 VDD + 0.8V VDD VVDD < 4.5V D040A 2.0 VDD V4.5V ≤ VDD ≤ 5.5V D041 with Schmitt Trigger buffer RC3 and RC4 0.8 VDD 0.7 VDD VDD VDD V V D042 MCLR 0.8 VDD VDD V D043 OSC1 0.7 VDD VDD V HS, HSPLL modes D043A D043B D043C D044 OSC1 OSC1 OSC1 T13CKI 0.8 VDD 0.9 VDD 1.6 1.6 VDD VDD VDD VDD V V V V EC mode RC mode(1) XT, LP modes IIL Input Leakage Current(2,3) D060 I/O ports — ±1 µAVSS ≤ VPIN ≤ VDD, Pin at high-impedance D061 MCLR — ±5 µAVss ≤ VPIN ≤ VDD D063 OSC1 — ±5 µAVss ≤ VPIN ≤ VDD IPU Weak Pull-up Current D070 IPURB PORTB weak pull-up current 50 400 µAVDD = 5V, VPIN = VSS Note 1: In RC oscillator configuration, the OSC1/CLKI pin is a Schmitt Trigger input. It is not recommended that the PICmicro® device be driven with an external clock while in RC mode. 2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified levels represent normal operating conditions. Higher leakage current may be measured at different input voltages. 3: Negative current is defined as current sourced by the pin. 4: Parameter is characterized but not tested. |
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