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STM32MP157C 데이터시트(PDF) 205 Page - STMicroelectronics |
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STM32MP157C 데이터시트(HTML) 205 Page - STMicroelectronics |
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205 / 260 page ![]() DS12505 Rev 5 205/260 STM32MP157C/F Electrical characteristics 238 tSAMP Sampling time in Sample and Hold mode CSH=100nF (Code transition between the lowest input code and the highest input code when DAC_OUT reaches final value ± 1LSB) DACMCR.MODEx[2:0] = 100/101 (BUFFER ON) -0.7 - ms DACMCR.MODEx[2:0] = 110 (BUFFER OFF) -11.5- DACMCR.MODEx[2:0] = 111 (INTERNAL BUFFER OFF) -0.3 - CIint Internal sample and hold capacitor -- 2.2 - pF Voffset Middle code offset for 1 trim code step VREF+ = 3.6 V - 450 - µV VREF+ = 1.8 V - 213 - IDDA(DAC) DAC quiescent consumption from VDDA DAC output buffer ON No load, middle code (0x800) - 360 - µA No load, worst code (0xF1C) - 490 - DAC output buffer OFF No load, middle/worst code (0x800) -20- Sample and Hold mode, CSH = 100 nF - 360×TON/ (TON+TOFF) (5) - IDDV(DAC) DAC consumption from VREF+ DAC output buffer ON No load, middle code (0x800) - 170 - No load, worst code (0xF1C) - 170 - DAC output buffer OFF No load, middle/worst code (0x800) - 160 - Sample and Hold mode, Buffer ON, CSH = 100 nF (worst code) - 170×TON/ (TON+TOFF) (5) - Sample and Hold mode, Buffer OFF, CSH = 100 nF (worst code) - 170×TON/ (TON+TOFF) (5) - 1. Guaranteed by design. 2. Unless otherwise noted, CL ≤ 50 pF with RL ≥ 5 kΩ when DAC output buffer is ON, or CL ≤ 10 pF with no RL when DAC output buffer is OFF. 3. Since VREF+ must always be ≤ VDDA, maximum VDAC_OUT = minimum value between Max(VREF+) and Max(VDDA-0.2) 4. In buffered mode, the output can overshoot above the final value for low input code (starting from the minimum value). 5. TON is the refresh phase duration, while TOFF is the hold phase duration. Refer to the product reference manual for more details. Table 80. DAC characteristics(1)(2) (continued) Symbol Parameter Conditions Min Typ Max Unit |
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