D301 datasheet(320/416 Pages) MICROCHIP

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DS30010118D-page 320

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27.4

Measuring Die Temperature

The CTMU can be configured to use the A/D to

measure the die temperature using dedicated A/D

Channel 24. Perform the following steps to measure

the diode voltage:

• The internal current source must be set for either

5.5 µA (IRNG<1:0> = 0x2) or 55 µA

(IRNG<1:0> = 0x3).

• In order to route the current source to the diode,

the EDG1STAT and EDG2STAT bits must be

equal (either both ‘0’ or both ‘1’).

• The CTMREQ bit (AD1CON5<13>) must be set

to ‘1’.

• The A/D Channel Select bits must be 24 (0x18)

using a single-ended measurement.

The voltage of the diode will vary over temperature

according to the graphs shown below (Figure 27-4). Note

that the graphs are different, based on the magnitude of

the current source selected. The slopes are nearly linear

over the range of -40°C to +100°C and the temperature

can be calculated as follows:

EQUATION 27-2:

FIGURE 27-4:

DIODE VOLTAGE (mV) vs. DIE TEMPERATURE (TYPICAL)

710 mV – Vdiode

1.8

Tdie =

760 mV – Vdiode

1.55

Tdie =

For 5.5 µA Current Source:

For 55 µA Current Source:

where Vdiode is in mV, Tdie is in °C

450

475

500

525

550

575

600

625

650

675

700

725

750

775

800

825

850

-40

-20

2040

6080

100

120

5.5UA

55UA

Die Temperature (°C)

5.5 µA

55 µA

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