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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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STM32F412RGT7P 데이터시트(PDF) 143 Page - STMicroelectronics |
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STM32F412RGT7P 데이터시트(HTML) 143 Page - STMicroelectronics |
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143 / 201 page  DocID028087 Rev 7 143/201 STM32F412xE/G Electrical characteristics 166 Table 74. ADC accuracy at fADC = 30 MHz(1) 1. Better performance could be achieved in restricted VDD, frequency and temperature ranges. Symbol Parameter Test conditions Typ Max(2) 2. Guaranteed by characterization, not tested in production. Unit ET Total unadjusted error fADC = 30 MHz, RAIN < 10 kΩ, VDDA = 2.4 to 3.6 V, VREF = 1.7 to 3.6 V, VDDA −VREF < 1.2 V ±2 ±5 LSB EO Offset error ±1.5 ±2.5 EG Gain error ±1.5 ±4 ED Differential linearity error ±1 ±2 EL Integral linearity error ±1.5 ±3 Table 75. ADC accuracy at fADC = 36 MHz(1) 1. Better performance could be achieved in restricted VDD, frequency and temperature ranges. Symbol Parameter Test conditions Typ Max(2) 2. Guaranteed by characterization, not tested in production. Unit ET Total unadjusted error fADC =36 MHz, VDDA = 2.4 to 3.6 V, VREF = 1.7 to 3.6 V VDDA −VREF < 1.2 V ±4 ±7 LSB EO Offset error ±2 ±3 EG Gain error ±3 ±6 ED Differential linearity error ±2 ±3 EL Integral linearity error ±3 ±6 Table 76. ADC dynamic accuracy at fADC = 18 MHz - limited test conditions(1) Symbol Parameter Test conditions Min Typ Max Unit ENOB Effective number of bits fADC =18 MHz VDDA = VREF+= 1.7 V Input Frequency = 20 kHz Temperature = 25 °C 10.3 10.4 - bits SINAD Signal-to-noise and distortion ratio 64 64.2 - dB SNR Signal-to-noise ratio 64 65 - THD Total harmonic distortion - -72 -67 1. Guaranteed by characterization, not tested in production. Table 77. ADC dynamic accuracy at fADC = 36 MHz - limited test conditions(1) Symbol Parameter Test conditions Min Typ Max Unit ENOB Effective number of bits fADC = 36 MHz VDDA = VREF+ = 3.3 V Input Frequency = 20 kHz Temperature = 25 °C 10.6 10.8 - bits SINAD Signal-to noise and distortion ratio 66 67 - dB SNR Signal-to noise ratio 64 68 - THD Total harmonic distortion - -72 -70 1. Guaranteed by characterization, not tested in production. |
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