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STM32F412RGU6 데이터시트(PDF) 120 Page - STMicroelectronics

부품명 STM32F412RGU6
상세설명  Arm®-Cortex®-M4 32b MCUFPU, 125 DMIPS, 1MB Flash, 256KB RAM, USB OTG FS, 17 TIMs, 1 ADC, 17 comm. interfaces
PDF  201 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F412RGU6 데이터시트(HTML) 120 Page - STMicroelectronics

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Electrical characteristics
STM32F412xE/G
120/201
DocID028087 Rev 7
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC code, is running. This emission test is compliant with IEC61967-2
standard which specifies the test board and the pin loading.
Table 53. EMI characteristics for LQFP144
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fCPU]
Unit
8/100 MHz
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C, LQFP144
package, conforming to IEC 61967-2,
EEMBC, ART ON, all peripheral clocks
enabled, clock dithering disabled.
0.1 to 30 MHz
20
dBµV
30 to 130 MHz
28
130 MHz to 1 GHz
21
EMI Level
3.5
-



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