| 전자부품 데이터시트 검색엔진 |
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L9680 데이터시트(PDF) 177 Page - STMicroelectronics |
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L9680 데이터시트(HTML) 177 Page - STMicroelectronics |
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177 / 286 page ![]() DS11615 Rev 7 177/286 L9680 Deployment drivers 285 Figure 38. High level loop diagnostic flow 2 Low level diagnostic is selected (bit 15 of LPDIAGREQ is low) OR an invalid high level diagnostic is selected OR we are in DEP_ENABLED state End of setting time End of setting time End of conversion Store result in ADCRESC End of conversion Store result in ADCRESD Off time elapsed AND new diagnostic request is SQUIB/PYROSWITCH RESISTANCE RANGE test Resistance test setting time = 304μs/1200μs TIP = 0 Resistance range test time elapsed Latch HSR_HI, HSR_LO flags TIP = 1 TIP = 1 Enable ISINK Enable ISRC BYPASS ISRC on SRx TIP = 1 Enable VRCM Enable ISINK Enable ISRC on SFx Enable ISINK TIP = 1 Off time elapsed AND new diagnostic request is SQUIB/PYROSWITCH RESISTANCE measure test Off time = 24μs New high level diagnostic request (bit 15 of LPDIAGREQ is high) Wait enough time to be sure that all currents and voltages supplies start in OFF state Resistance range test setting time = 152μs/600μs SQUIB/PYROSWITCH RES RANGE TEST DIAG_OFF WAIT_OFF Resistance test setting time = 304μs/1200μs RES MEAS SETTLE2 RES MEAS CONV12 SQUIB/PYROSWITCH RES MEAS CONV1 SQUIB/PYROSWITCH SQUIB/PYROSWITCH RES MEAS SETTLE2 SQUIB/PYROSWITCH |
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