PSD413A2 datasheet(105/123 Pages) STMICROELECTRONICS

105 / 123 page

PSD4XX Family

102

Symbol

Parameter 14

Conditions Typical15 Max Unit

CIN

Capacitance (for input pins only)

VIN = 0 V

COUT

Capacitance (for input/output pins)

VOUT = 0 V

CVPP

Capacitance (for WR/VPP or R/W/VPP)VPP = 0 V

NOTES: 14. These parameters are only sampled and are not 100% tested.

15. Typical values are for TA = 25°C and nominal supply voltages.

TA = 25 °C, f = 1 MHz

15.0

Pin Capacitance

16.0

AC Testing

Figure 51. AC Testing Load Circuit

17.0

Erasure and

Programming

3.0V

TEST POINT

1.5V

DEVICE

UNDER TEST

2.01 V

195

Ω

L = 30 pF

(INCLUDING

SCOPE AND JIG

CAPACITANCE)

To clear all locations of their programmed contents, expose the window packaged device

to an ultra-violet light source. A dosage of 30 W second/cm2 is required (40 W second/cm2

for ZPSD4XXV versions). This dosage can be obtained with exposure to a wavelength of

2537 Å and intensity of 12000 µW/cm2 for 40 to 45 minutes (55 to 60 minutes for

ZPSD4XXV versions). The device should be about 1 inch from the source, and all filters

should be removed from the UV light source prior to erasure.

The PSD4XX and similar devices will erase with light sources having wavelengths shorter

than 4000 Å. Although the erasure times will be much longer than with UV sources at 2537

Å, exposure to fluorescent light and sunlight eventually erases the device. For maximum

system reliability, these sources should be avoided. If used in such an environment, the

package windows should be covered by an opaque substance.

Upon delivery from ST, or after each erasure, the PSD4XX device has all bits in the PAD

and EPROM in the “1” or high state. The configuration bits are in the “0” or low state. The

code, configuration, and PAD MAP data are loaded through the procedure of programming

Information for programming the device is available directly from ST. Please contact your

local sales representative.

Figure 50. AC Testing Input/Output Waveform

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