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PIC12F615-E/MS 데이터시트(PDF) 167 Page - Microchip Technology

부품명 PIC12F615-E/MS
상세설명  8-Pin, Flash-Based 8-Bit CMOS Microcontrollers
PDF  212 Pages
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제조업체  MICROCHIP [Microchip Technology]
홈페이지  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

PIC12F615-E/MS 데이터시트(HTML) 167 Page - Microchip Technology

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 2010 Microchip Technology Inc.
DS41302D-page 167
PIC12F609/615/617/12HV609/615
16.12 High Temperature Operation
This
section outlines
the specifications
for
the
PIC12F615 device operating in a temperature range
between -40°C and 150°C.(4) The specifications
between -40°C and 150°C(4) are identical to those
shown in DS41288 and DS80329.
TABLE 16-13: ABSOLUTE MAXIMUM RATINGS
Note 1: Writes
are
not
allowed
for
Flash
Program Memory above 125°C.
2: All AC timing specifications are increased
by 30%. This derating factor will include
parameters such as TPWRT.
3: The temperature range indicator in the
part number is “H” for -40°C to 150°C.(4)
Example: PIC12F615T-H/ST indicates the
device is shipped in a TAPE and reel
configuration, in the MSOP package, and
is rated for operation from -40°C to
150°C.(4)
4: AEC-Q100 reliability testing for devices
intended to operate at 150°C is 1,000
hours. Any design in which the total oper-
ating time from 125°C to 150°C will be
greater than 1,000 hours is not warranted
without
prior
written
approval
from
Microchip Technology Inc.
Parameter
Source/Sink
Value
Units
Max. Current: VDD
Source
20
mA
Max. Current: VSS
Sink
50
mA
Max. Current: PIN
Source
5
mA
Max. Current: PIN
Sink
10
mA
Pin Current: at VOH
Source
3
mA
Pin Current: at VOL
Sink
8.5
mA
Port Current: GPIO
Source
20
mA
Port Current: GPIO
Sink
50
mA
Maximum Junction Temperature
155
°C
Note:
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the
device. This is a stress rating only, and functional operation of the device at those or any other conditions
above those indicated in the operation listings of this specification is not implied. Exposure above
maximum rating conditions for extended periods may affect device reliability.



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