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PIC18F23K22-E/ML 데이터시트(PDF) 421 Page - Microchip Technology

부품명 PIC18F23K22-E/ML
상세설명  28/40/44-Pin, Low-Power, High-Performance Microcontrollers with nanoWatt XLP Technology
PDF  496 Pages
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제조업체  MICROCHIP [Microchip Technology]
홈페이지  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

PIC18F23K22-E/ML 데이터시트(HTML) 421 Page - Microchip Technology

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 2010 Microchip Technology Inc.
Preliminary
DS41412C-page 421
PIC18(L)F2X/4XK22
27.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings (†)
Ambient temperature under bias.............................................................................................................-40°C to +125°C
Storage temperature .............................................................................................................................. -65°C to +150°C
Voltage on any pin with respect to VSS (except VDD, and MCLR) .................................................. -0.3V to (VDD + 0.3V)
Voltage on VDD with respect to VSS
PIC18LF46K22 ......................................................................................................... -0.3V to +4.5V
PIC18F46K22 ........................................................................................................... -0.3V to +6.5V
Voltage on MCLR with respect to VSS (Note 2) ............................................................................................0V to +11.0V
Total power dissipation (Note 1) ...............................................................................................................................1.0W
Maximum current out of VSS pin (-40°C to +85°C) .............................................................................................. 300 mA
Maximum current out of VSS pin (+85°C to +125°C)............................................................................................ 125 mA
Maximum current into VDD pin (-40°C to +85°C) ................................................................................................ 200 mA
Maximum current into VDD pin (+85°C to +125°C) ................................................................................................85 mA
Input clamp current, IIK (VI < 0 or VI > VDD)
 20 mA
Output clamp current, IOK (VO < 0 or VO > VDD)
 20 mA
Maximum output current sunk by any I/O pin..........................................................................................................25 mA
Maximum output current sourced by any I/O pin ....................................................................................................25 mA
Maximum current sunk by
all ports (-40°C to +85°C)........................................................................................... 200 mA
Maximum current sunk by
all ports (+85°C to +125°C)......................................................................................... 110 mA
Maximum current sourced by all ports (-40°C to +85°C) ......................................................................................185 mA
Maximum current sourced by all ports (+85°C to +125°C) .....................................................................................70 mA
Note 1: Power dissipation is calculated as follows:
Pdis = VDD x {IDD –
 IOH} +  {(VDD – VOH) x IOH} + (VOL x IOL)
2: Voltage spikes below VSS at the MCLR/VPP/RE3 pin, inducing currents greater than 80 mA, may cause
latch-up. Thus, a series resistor of 50-100
 should be used when applying a “low” level to the MCLR/VPP/
RE3 pin, rather than pulling this pin directly to VSS.
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.



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