PCM5100, PCM5101, PCM5102

www.ti.com

SLAS764

– MAY 2011

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)

VALUE

UNIT

Supply Voltage

AVDD, CPVDD, DVDD

–0.3 to 3.9

Digital Input Voltage

–0.3 to 3.9

V

Analog Input Voltage

–0.3 to 3.9

Operating Temperature Range

–25 to 85

°C

Storage Temperature Range

–65 to 150

THERMAL CHARACTERISTICS

over operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Theta JA

High K

91.2

Psi JT

1.0

Psi JB

41.5

ºC/W

Theta JC

Top

25.3

Theta JB

42.0

Device Power Dissipation

94.4

185

mW

ELECTRICAL CHARACTERISTICS

otherwise noted.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Resolution

16

24

32

Bits

Data Format (PCM Mode)

Audio data interface format

Audio data bit length

16, 24, 32-bit acceptable

Audio data format

MSB First, 2

’s Complement

Sampling frequency

8

384

kHz

System clock frequency

64, 128, 192, 256, 384, 512, 768, 1024, 1152, 1536, 2048, or

3072

Digital Input/Output

Logic Family: 3.3V LVCMOS compatible

0.7

Input logic level

V

0.3

10

Input logic current

µA

–10

0.8

Output logic level

V

0.22

Copyright

© 2011, Texas Instruments Incorporated

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