ANSELA datasheet(121/222 Pages) MICROCHIP

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DS22331A-page 121

MCP19111

21.0

INTERNAL TEMPERATURE

INDICATOR MODULE

The MCP19111 is equipped with a temperature circuit

designed to measure the operating temperature of the

silicon die. The circuit's range of the operating

temperature falls between -40°C and +125°C. The

output is a voltage that is proportional to the device

temperature. The output of the temperature indicator is

internally connected to the device ADC.

21.1

Circuit Operation

The

TMPSEN

bit

the

ABECON

measurement circuit. The MCP19111 overtemperature

shutdown feature is NOT controlled by this bit.

FIGURE 21-1:

TEMPERATURE CIRCUIT

DIAGRAM

21.2

Temperature Output

The output of the circuit is measured using the internal

analog-to-digital converter. Channel 10 is reserved for

the temperature circuit output. Refer to Section 22.0

“Analog-to-Digital Converter (ADC) Module” for

detailed information.

The temperature of the silicon die can be calculated by

the ADC measurement by using Equation 21-1.

EQUATION 21-1:

SILICON DIE

TEMPERATURE

TSEN

ADC

MUX

TSRNG

VDD

ADC

CHS bits

(ADCON0 register)

VOUT

TEMP_DIE

ADC READING

1.75

–

13.3mV/

C

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