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STM32F103RCT7 데이터시트(PDF) 104 Page - STMicroelectronics

부품명 STM32F103RCT7
상세설명  High-density performance line ARM-based 32-bit MCU with 256 to 512KB Flash, USB, CAN, 11 timers, 3 ADCs, 13 communication interfaces
PDF  130 Pages
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STM32F103RCT7 데이터시트(HTML) 104 Page - STMicroelectronics

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Electrical characteristics
STM32F103xC, STM32F103xD, STM32F103xE
104/130
Doc ID 14611 Rev 8
Equation 1: RAIN max formula
The formula above (Equation 1) is used to determine the maximum external impedance
allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 60.
RAIN max for fADC = 14 MHz
(1)
1.
Guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (kΩ)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
Table 61.
ADC accuracy - limited test conditions(1)(2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.14 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterisation, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 56 MHz,
fADC = 14 MHz, RAIN < 10 kΩ,
VDDA = 3 V to 3.6 V
TA = 25 °C
Measurements made after
ADC calibration
VREF+ = VDDA
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
R
AIN
T
S
f
ADC
C
ADC
2
N2
+
()
ln
×
×
--------------------------------------------------------------
R
ADC
<



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