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1689-9601 데이터시트 (PDF) - IET Labs Inc.

1689-9601 Datasheet PDF - IET Labs Inc.
부품명 1689-9601
다운로드  1689-9601 다운로드
파일 크기   95.54 Kbytes
페이지   2 Pages
제조업체  IET [IET Labs Inc.]
홈페이지  https://www.ietlabs.com/
Logo IET - IET Labs Inc.
상세설명 Cost Effective, Accurate, Impedance

1689-9601 Datasheet (PDF)

Go To PDF Page 다운로드 데이터시트
1689-9601 Datasheet PDF - IET Labs Inc.

부품명 1689-9601
다운로드  1689-9601 Click to download

파일 크기   95.54 Kbytes
페이지   2 Pages
제조업체  IET [IET Labs Inc.]
홈페이지  https://www.ietlabs.com/
Logo IET - IET Labs Inc.
상세설명 Cost Effective, Accurate, Impedance

1689-9601 데이터시트 (HTML) - IET Labs Inc.


1689-9601 제품 세부 정보

Description
The 1692 is a sophisticated, microprocessor-controlled tester that brings new levels of flexibility, simplicity and accuracy
to RLC measurement. It's testing automation at its best with a range of programmable test frequencies and test
voltages, as well as automatic limit comparison, automatic parameter selection, remote programmability, automatic
binning and automatic zeroing.
The display facilitates visual acquisition of test data and eliminates costly guesswork and errors.The 1692 provides a
powerful combination of features designed to maximize productivity in production testing applications.
• 0.05% Accuracy for RLC measurements; 0.0003 for D and Q measurements.
• Five selectable test frequencies: 100Hz, 120Hz, lkHz, 10kHz and 100kHz for greater versatility in component testing.•
Choice of two commonly specified AC test voltages.
• Three keyboard-selectable test speeds; 2,4 or 8 measurements per second complements automatic handling
equipment to maximize throughput.
• A choice of two measurement modes; Triggered and Continuous with averaging available in each ensures measurement
flexibility.
• Wide choice of measurement parameters allow you to work with familiar units.
• A full, five-digit LED display for RLC measurements and a four-digit readout for D and Q testing, simultaneously
display both test results for each measurement, automatically
• Guarded Kelvin measurement techniques protect measurement integrity.
• Automatic limit comparison and binning ensure fast, mistake-proof sorting of components.




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