Members of the Texas Instruments
SCOPE E Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Functionally Equivalent to ’F543 and
ABT543 in the Normal-Function Mode
SCOPE E Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
State-of-the-Art EPIC-IIBE BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic
DIPs (JT)

description
The ’ABT8543 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPEE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPEE octal registered bus transceivers.