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SN74LVC1G79 데이터시트 (PDF) - Texas Instruments

SN74LVC1G79 Datasheet PDF - Texas Instruments
부품명 SN74LVC1G79
다운로드  SN74LVC1G79 다운로드
파일 크기   1038.81 Kbytes
페이지   23 Pages
제조업체  TI2 [Texas Instruments]
홈페이지  https://www.ti.com
Logo TI2 - Texas Instruments
상세설명 SN74LVC1G79-Q1 Single Positive-Edge-Triggered D-Type Flip-Flop

SN74LVC1G79 Datasheet (PDF)

Go To PDF Page 다운로드 데이터시트
SN74LVC1G79 Datasheet PDF - Texas Instruments

부품명 SN74LVC1G79
다운로드  SN74LVC1G79 Click to download

파일 크기   1038.81 Kbytes
페이지   23 Pages
제조업체  TI2 [Texas Instruments]
홈페이지  https://www.ti.com
Logo TI2 - Texas Instruments
상세설명 SN74LVC1G79-Q1 Single Positive-Edge-Triggered D-Type Flip-Flop

SN74LVC1G79 데이터시트 (HTML) - Texas Instruments


SN74LVC1G79 제품 세부 정보

1 Features
1• Qualified for Automotive Applications
• AEC-Q100 Qualified With the Following Results:
– ±4000-V Human-Body Model (HBM) ESD
Classification Level 3A
– ±1000-V Charged-Device Model (CDM) ESD
Classification Level C5
• Supports 5-V VCC Operation
• Inputs Accept Voltages to 5.5 V
• Supports Down Translation to VCC
• Max tpd of 6 ns at 3.3 V and 50 pF load
• Low Power Consumption, 10-μA Max ICC
• ±24-mA Output Drive at 3.3 V
• Ioff supports Partial-Power-Down Mode and Back-
Drive Protection

2 Applications
• Automotive Infotainment
• Automotive Cluster
• Automotive ADAS
• Automotive Body Electronics
• Automotive HEV/EV Powertrain

3 Description
This automotive AEC-Q100 qualified single positiveedge-
triggered D-type flip-flop is designed for 1.65-V
to 5.5-V VCC operation.
When data at the data (D) input meets the setup time
requirement, the data is transferred to the Q output
on the positive-going edge of the clock pulse. Clock
triggering occurs at a voltage level and is not directly
related to the rise time of the clock pulse. Following
the hold-time interval, data at the D input can be
changed without affecting the level at the output.
This device is fully specified for partial-power-down
applications using Ioff. The Ioff circuitry disables the
outputs, preventing damaging current backflow
through the device when it is powered down.




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