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부품명	24009-APP

상세설명	High-Frequency Center Probe Test Socket with Adj. Pressure Pad for Devices up to 27mm Sq

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제조업체	ARIES [Aries Electronics, Inc.]

홈페이지	http://www.arieselec.com

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유사한 부품 번호 - 24009-APP

제조업체	부품명	데이터시트	상세설명
Aries Electronics, Inc.	24009	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 27mm Square
Toshiba Semiconductor	24009954	6Mb / 126P	COLOUR TELEVISION C9PJ Chassis 2000

제조업체	부품명	데이터시트	상세설명
Pomona Electronics	6232A	94Kb / 2P	Modular Test Probe with
Pomona Electronics	6574	141Kb / 2P	Alligator Clip with Boot for standard test probe
Tyco Electronics	1625854-3	87Kb / 1P	SMD Circuit Probe Pad
Aries Electronics, Inc.	24001HT	533Kb / 1P	High-Temp up to 250째C RF Test Socket with Replaceable Contact Strips
	24008	2Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 13mm Square
	24009	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 27mm Square
	24010	1Mb / 2P	Machined High-Frequency Center Probe Test Socket for BGA, CSP, & MLF Packages
	24011	2Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 40mm Square
	24012	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 55mm Square
	24013	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square