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AD9675KBCZ 데이터시트(PDF) 38 Page - Analog Devices |
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AD9675KBCZ 데이터시트(HTML) 38 Page - Analog Devices |
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38 / 61 page ![]() Data Sheet AD9675 Rev. A | Page 37 of 60 Digital Output Test Patterns Figure 55. Example of Data Flow Block Diagram Table 21. Flexible Output Test Modes—Address 0x00D Output Test Mode Bit Sequence Pattern Name Digital Output Word 1 Digital Output Word 2 Digital Output Word 3 Digital Output Word 4 Subject to Resolution Select 0000 Off (default) Not applicable Not applicable Not applicable Not applicable Not applicable 0001 Midscale short 10 0000 0000 0000 Same Same Same Yes 0010 +Full-scale short 11 1111 1111 1111 Same Same Same Yes 0011 −Full-scale short 00 0000 0000 0000 Same Same Same Yes 0100 Checkerboard output 10 1010 1010 1010 01 0101 0101 0101 10 1010 1010 1010 01 0101 0101 0101 No 0101 PN sequence long Not applicable Not applicable Not applicable Not applicable Yes 0110 PN sequence short Not applicable Not applicable Not applicable Not applicable Yes 0111 One-/zero-word toggle 11 1111 1111 1111 00 0000 0000 0000 11 1111 1111 1111 00 0000 0000 0000 No 1000 User input Address 0x019 and Address 0x01A Address 0x01B and Address 0x01C Address 0x01D and Address 0x01E Address 0x01F and Address 0x020 No 1001 to 1110 Reserved Not applicable Not applicable Not applicable Not applicable No 1111 Ramp output 00 0000 0000 0000 00 0000 0000 0001 00 0000 0000 0000 00 0000 0000 0001 Yes Table 22. Flexible Output Test Modes—Address 0x144 Output Test Mode Bit Sequence Pattern Name Digital Output Word 1 Digital Output Word 2 Digital Output Word 3 Digital Output Word 4 Subject to Resolution Select 0000 Off (default) Not applicable Not applicable Not applicable Not applicable Not applicable 0001 Alternating checkerboard 10 1010 1010 1010 01 0101 0101 0101 10 1010 1010 1010 01 0101 0101 0101 No 0010 One-/zero-word toggle 11 1111 1111 1111 00 0000 0000 0000 11 1111 1111 1111 00 0000 0000 0000 No 0011 PN sequence long Not applicable Not applicable Not applicable Not applicable Yes 0100 PN sequence short Not applicable Not applicable Not applicable Not applicable Yes 0101 Continuous/ repeat user test pattern Address 0x019 and Address 0x01A Address 0x01B and Address 0x01C Address 0x01D and Address 0x01E Address 0x01F and Address 0x020 No 0110 Single user test pattern Address 0x019 and Address 0x01A Address 0x01B and Address 0x01C Address 0x01D and Address 0x01E Address 0x01F and Address 0x020 No 0111 Ramp output 00 0000 0000 0000 00 0000 0000 0001 00 0000 0000 0000 00 0000 0000 0001 Yes 1000 Modified RPAT sequence See JESD204B specification See JESD204B specification See JESD204B specification See JESD204B specification Not applicable 1001 to 1111 Reserved Not applicable Not applicable No SAMPLE CONSTRUCTION SERIALIZER TEST PATTERNS OUTPUT PROCESSED SAMPLE FROM ADC 8-BIT/10-BIT ENCODER TEST PATTERNS FRAME/LANE ALIGNMENT CHARACTER GENERATION SCRAMBLER FRAME CONSTRUCTION TEST PATTERNS |
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