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DS3153N 데이터시트(PDF) 33 Page - Dallas Semiconductor

부품명 DS3153N
상세설명  Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
PDF  60 Pages
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제조업체  DALLAS [Dallas Semiconductor]
홈페이지  https://www.maximintegrated.com/en.html
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DS3153N 데이터시트(HTML) 33 Page - Dallas Semiconductor

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12.2 JTAG TAP Controller State Machine Description
This section discusses the operation of the TAP controller state machine. The TAP controller is a finite state
machine that responds to the logic level at JTMS on the rising edge of JTCLK. Each of the states denoted in Figure
12-2 are described in the following pages.
Figure 12-2. JTAG TAP Controller State Machine
Test-Logic-Reset. Upon device power-up, the TAP controller starts in the Test-Logic-Reset state. The instruction
register contains the IDCODE instruction. All system logic on the device operates normally.
Run-Test-Idle. Run-Test-Idle is used between scan operations or during specific tests. The instruction and test
registers remain idle.
Select-DR-Scan. All test registers retain their previous state. With JTMS low, a rising edge of JTCLK moves the
controller into the Capture-DR state and initiates a scan sequence. JTMS high moves the controller to the Select-
IR-SCAN state.
Capture-DR. Data can be parallel loaded into the test data registers selected by the current instruction. If the
instruction does not call for a parallel load or the selected register does not allow parallel loads, the test register
remains at its current value. On the rising edge of JTCLK, the controller goes to the Shift-DR state if JTMS is low or
to the Exit1-DR state if JTMS is high.
Test-Logic-Reset
Run-Test/Idle
Select
DR-Scan
1
0
Capture-DR
1
0
Shift-DR
0
1
Exit1- DR
1
0
Pause-DR
1
Exit2-DR
1
Update-DR
0
0
1
Select
IR-Scan
1
0
Capture-IR
0
Shift-IR
0
1
Exit1-IR
1
0
Pause-IR
1
Exit2-IR
1
Update-IR
0
0
1
0
0
1
0
1
0
1



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