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ISL55100AEVAL3Z 데이터시트(PDF) 4 Page - Renesas Technology Corp |
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ISL55100AEVAL3Z 데이터시트(HTML) 4 Page - Renesas Technology Corp |
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4 / 14 page ![]() ISL55100A FN7486 Rev 3.00 Page 4 of 14 December 4, 2014 Absolute Maximum Ratings Thermal Information VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 19V VEXT to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V Input Voltages DATA, DRV EN, CVX, VH, VL, VINP, COMPX, LOWSWING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (VEE - 0.5V) to (VCC + 0.5V) Output Voltages DOUT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (VEE - 0.5V) to (VH + 0.5V) QX . . . . . . . . . . . . . . . . . . . . . (COMP LOW - 0.5V) to (COMP HIGH + 0.5V) Thermal Resistance (Typical, Notes 4, 5) JA (°C/W) JC (°C/W) 72 Ld QFN Package . . . . . . . . . . . . . . . . . . . 23 2.0 Maximum Junction Temperature (Plastic Package) . . . . . . . . . . . +150°C Maximum Storage Temperature Range . . . . . . . . . . . . . -65°C to +150°C Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493 CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and result in failures not covered by warranty. NOTES: 4. JA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See Tech Brief TB379. 5. For JC, the “case temp” location is the center of the exposed metal pad on the package underside. 6. Device temperature is closely tied to data-rates, driver loads and overall pin activity. Review “Power Dissipation Considerations” on page 9 for more information. Recommended Operating Conditions PARAMETER SYMBOL MIN (Note 13)TYP MAX (Note 13)UNITS Device Power-(VEXT = VEE) VEXT Not Used VCC - VEE 12 (Note 10)15 18 V Device Power-(VEXT = VEE + 5.5V) VCC - VEE 9 (Note 10)15 18 V VEXT Optional External Logic Power VEXT - VEE 5.5 (Note 10) 5.75 6.0 V Driver Output High Rail VH VEE + 1 - VCC - 0.5 V Driver Output Low Rail VL VEE + 0.5 - VEE + 6 V Comparator Output High Rail COMP-High VEE + 1 - VCC - 0.5 V Comparator Output Low Rail COMP-Low VEE + 0.5 - VEE + 6 V Ambient Temperature TA -40 - +85 °C Junction Temperature TJ - - +150 °C Electrical Specifications Test Conditions: VCC = 12V, VEE = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp-Low = 0V, V5V = VEE and LOWSWING = VCC. PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS DRIVER DC CHARACTERISTICS ISL55100A Output Resistance ROUTD IO = ±200mA, data not toggling 3 4.5 7.0 Ω ISL55100A DC Output Current IOUTD Per Individual driver ±200 - - mA ISL55100A AC Output Current (Note 6)IOUTDAC Per Individual driver - 1.0 - A ISL55100A Minimum Output Swing VOMIN VH = 200mV, VL = 0V 185 - - mV Disabled HIZ Leakage Current HIZ VOUT = VCC with VH = VL + VEE or VOUT = VEE with VH = VL = VCC -1 0 1 µA DRIVER TIMING CHARACTERISTICS Data to DOUT Propagation Delay tPD Lowswing Disabled (Note 9)8 12 16 ns Lowswing Enabled (Note 9)9 13 17 ns Driver Timing Skew, All Edges (Note 7) - <1 - ns Disable (HIZ) Time tDIS DVREN Transition from Enable to Disable 16 18 26 ns |
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