AFT09S200W02S datasheet(2/13 Pages) NXP

2 / 13 page

RF Device Data

Freescale Semiconductor, Inc.

AFT09S200W02SR3

Table 1. Maximum Ratings

Rating

Symbol

Value

Unit

Drain--Source Voltage

VDSS

–0.5, +70

Vdc

Gate--Source Voltage

VGS

–6.0, +10

Vdc

Operating Voltage

VDD

32, +0

Vdc

Storage Temperature Range

Tstg

–65 to +150

C

Case Operating Temperature Range

–40 to +125

C

Operating Junction Temperature Range (1,2)

–40 to +225

C

CW Operation @ TC =25C

Derate above 25C

226

1.1

W/C

Table 2. Thermal Characteristics

Characteristic

Symbol

Value (2,3)

Unit

Thermal Resistance, Junction to Case

Case Temperature 81C, 56 W CW, 28 Vdc, IDQ = 1400 mA, 940 MHz

RJC

0.34

C/W

Table 3. ESD Protection Characteristics

Test Methodology

Class

Human Body Model (per JESD22--A114)

Machine Model (per EIA/JESD22--A115)

Charge Device Model (per JESD22--C101)

Table 4. Electrical Characteristics (TA =25C unless otherwise noted)

Characteristic

Symbol

Min

Typ

Max

Unit

Off Characteristics

Zero Gate Voltage Drain Leakage Current

(VDS =70 Vdc, VGS =0 Vdc)

IDSS

—

Adc

Zero Gate Voltage Drain Leakage Current

(VDS =32 Vdc, VGS =0 Vdc)

IDSS

—

Adc

Gate--Source Leakage Current

(VGS =5 Vdc, VDS =0 Vdc)

IGSS

—

Adc

On Characteristics

Gate Threshold Voltage

(VDS =10 Vdc, ID = 270 Adc)

VGS(th)

1.0

1.5

2.0

Vdc

Gate Quiescent Voltage

(VDS =28 Vdc, ID = 1400 mAdc)

VGS(Q)

—

2.15

—

Vdc

Fixture Gate Quiescent Voltage (4)

(VDD =28 Vdc, ID = 1400 mAdc, Measured in Functional Test)

VGG(Q)

3.2

4.3

5.2

Vdc

Drain--Source On--Voltage

(VGS =10 Vdc, ID =2.7 Adc)

VDS(on)

0.1

0.26

0.3

Vdc

1. Continuous use at maximum temperature will affect MTTF.

2. MTTF calculator available at http://www.freescale.com/rf/calculators.

3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf and search for AN1955.

4. VGG =2  VGS(Q). Parameter measured on Freescale Text Fixture, due to resistor divider network on the board. Refer to Test Fixture Layout.

(continued)

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