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FUSB252 데이터시트(PDF) 12 Page - ON Semiconductor |
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FUSB252 데이터시트(HTML) 12 Page - ON Semiconductor |
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12 / 18 page ![]() © 2017 Semiconductor Components Industries, LLC www.onsemi.com FUSB252 • Rev. 1.5 11 Test Diagrams (Continued) Figure 15. Break-Before-Make Interval Timing Figure 16. Bandwidth Figure 17. Channel Off Isolation Figure 18. Non-Adjacent Channel-to-Channel Crosstalk Capacitance Meter HSDn Dn S=LOW or HIGH OE=HIGH Capacitance Meter HSDn Dn S=LOW or HIGH OE=LOW Figure 19. Channel Off Capacitance Figure 20. Channel On Capacitance Vcc 0.9*Vout Vcc/2 t BBM 0V VOUT Input - V Sel 0.9*Vout tRISE= 2.5ns 90% 10% CL HSDn RL Dn GND GND RS VSel V SW1 GND V OUT V SW2 GND -- R L , R S , and CL are functions of the application environment (see AC Tables for specific values) C L includes test fixture and stray capacitance. V OUT GND GND R T GND GND V S R S Network Analyzer VSel GND R S and RT are functions of the application environment (see AC Tables for specific values). V IN R S and RT are functions of the application environment (see AC Tables for specific values). VOUT GND GND RT GND GND VS RS Network Analyzer RT GND VSel GND VIN RT Off isolation = 20 Log (VOUT / VIN) VOUT GND GND RT GND GND VS RS Network Analyzer RT GND R S and RT are functions of the application environment (see AC Tables for specific values). VSel GND NC VIN Crosstalk = 20 Log (VOUT / VIN) |
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