CAT34C02

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2

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameter

Rating

Unit

Operating Temperature

−45 to +130

°C

Storage Temperature

−65 to +150

°C

Voltage on Any Pin with Respect to Ground (Note 1)

−0.5 to +6.5

V

−0.5 to +10.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. The DC input voltage on any pin should not be lower than −0.5 V. During transitions, the voltage on any pin may undershoot to no less than

−1.5 V, for periods of less than 20 ns.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program/ Erase Cycles

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

Table 3. D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Max

Units

Supply Current

1

mA

2

Standby Current

1

mA

3

5

I/O Pin Leakage

2

mA

Input Low Voltage

−0.5

V

Input High Voltage

Output Low Voltage

0.4

0.2

Table 4. PIN IMPEDANCE CHARACTERISTICS

Symbol

Parameter

Conditions

Max

Units

SDA I/O Pin Capacitance

8

pF

Other Input Pins

6

WP Input Current

130

mA

120

80

2

Address Input Current

(A0, A1, A2)

Product Rev H

50

mA

35

25

2

4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

5. When not driven, the WP, A0, A1 and A2 pins are pulled down to GND internally. For improved noise immunity, the internal pull−down is relatively

strong; therefore the external driver must be able to supply the pull−down current when attempting to drive the input HIGH. To conserve power,