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XUJ736125I 데이터시트(PDF) 2 Page - Integrated Device Technology |
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XUJ736125I 데이터시트(HTML) 2 Page - Integrated Device Technology |
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2 / 21 page ![]() 2 ©2018 Integrated Device Technology, Inc. June 25, 2018 XU Datasheet Absolut e M a x im um Ra t ings Stresses above the ratings listed below can cause permanent damage to the device. These ratings, which are standard values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over the recommended operating temperature range. T a ble 3 . Absolut e M a x im um Ra t ings Item Rating ESD Com plia nc e T a ble 4 . ESD Com plia nc e M e c ha nic a l T e st ing T a ble 5 . M e c ha nic a l T e st ing * Parameter Test Method * MSL level does not apply. Solde r Re flow Profile tP 10 seconds Max within5°C of 260°C peak Ramp down not to exceed 6°C/s Ramp up 3°C/s Max 120 ±20 seconds in pre-heating area 50 ±10 seconds above 225°C reflow area 400 seconds Max from +25°C to 260°C peak 25°C 160°C 180°C 225°C 260°C VDD -0.5 to +5.0V E/D -0.5V to VDD + 0.5V OUT -0.5V to VDD + 0.5V Storage Temperature -55°C to 125°C Maximum Junction Temperature 125°C Core Current 65mA maximum Theta JA JU6 75.9 °C/W JS6 89.6 °C/W Theta JB 48.6°C/W 54.3 °C/W Human Body Model (HBM) 1000V Mechanical Shock Half-sine wave with 0.3ms 3000G. X, Y, Z each direction 1 time. Mechanical Vibration Frequency: 10 to 55MHz amplitude: 1.5mm. Frequency: 55–2000Hz peak value: 20G. Duration time: 4H for each X,Y,Z axis; total 12hours. High Temp Operating Life (HTOL) 2000 hours at 125°C (under power). Hermetic Seal Gross leak (air leak test). Fine leak (Helium leak test) He-pressure: 6kgf/cm² 2 hours. |
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