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CB2012T2R2M 데이터시트(PDF) 13 Page - List of Unclassifed Manufacturers

부품명 CB2012T2R2M
상세설명  WOUND CHIP INDUCTORS
PDF  16 Pages
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제조업체  ETC1 [List of Unclassifed Manufacturers]
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Logo ETC1 - List of Unclassifed Manufacturers

CB2012T2R2M 데이터시트(HTML) 13 Page - List of Unclassifed Manufacturers

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207
5
RELIABILITY DATA
6/8
Item
Specified Value
Test Methods and Remarks
18.Thermal shock
19.Damp heat
△L/L→
WithinM10L
Q
→
10N
:10min.
12NV33N
:
15min.
39NVR10
:
20min.
R12V4R7
:
30min.
5R6V330
:
25min.
390V820
:
20min.
101
:15min.
△L/L→WithinM10L
△L/L→
WithinM5L
※△L/L→
withinM0.5nH
under
8.2
nH
△Q/Q→
withinM20L
※△Q/Q→
withinM5 under
8.2
nH
△L/L→
WithinM10L
Q
→
10N
:10min.
12NV33N
:
15min.
39NVR10
:
20min.
R12V4R7
:
30min.
5R6V330
:
25min.
390V820
:
20min.
101
:15min.
△L/L→WithinM10L
△L/L→
WithinM5L
※△L/L→
withinM0.5nH
under
8.2
nH
△Q/Q→
WithinM20L
※△Q/Q→
withinM5 under
8.2
nH
Conditions for 1cycle
Step
TemperaturefCg
Durationfming
1
K
40
30
2
J
85
30
Temperature for
:LEM2520
Number of cycle
:100 cycle
Recovery
:At least 1 hr of recovery the stan-
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
LBYLBCYCBYCBCYCBLYLBH
:
K
40VJ85C, miantain times 30min. ,100 cycle
Recovery
:At least 1 hr of recovery under
the standard condition after the
test, followed by the measure-
ment within 2 hrs.
Temperature
:60M2C
Humidity
:90V95LRH
Duration
:1000 hrs
Recovery
:At least 1 hr of recovery the stan-
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
LEM2520
LBH1608
LB2518
LB2016
LB2012
LB1608
LBC2518
LBC2016
LBC2012
CB2518
CB2016
CB2012
CBC3225
CBC2518
CBC2016
CBC2012
CBL2012



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