| 전자부품 데이터시트 검색엔진 |
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FS9952_LP1 데이터시트(PDF) 28 Page - Fortune Semiconductor Corp. |
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FS9952_LP1 데이터시트(HTML) 28 Page - Fortune Semiconductor Corp. |
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28 / 31 page ![]() FS9952_LP1 Rev. 2.0 28/31 15.15 Open-Short Test ONEK SMV AGND _ + RA 50k RB 1k R17 900k R19 1k PTC J8 J6 Rx VREF 0.4V FS9952 V/Ohm COM Diagram 30 Open-Short Test When doing the open-short test, the inner of IC will generate 0.4V voltage (relative to AGND) that is output from R19 and is added to open-short measuring point through PTC. J6 and J8 are mode switches that are close during doing the open-short test. Rx gets voltage VRx, and enters IC through R17. From the diagram we know that Rx=(R19+PTC)/50 So, the resistance value of PTC will influence the upper limit of open-short test resistance. When not connect to PTC, if R22 is 1kΩ, then the resistance of the buzzer sound is smaller than 30Ω. 15.16 AC Large Current Clamp Meter Measurement Circuit 5 SA 30 AGND FS9952 RL VR R R29 100k Diagram 31 AC Large Current Measurement 15.17 Triode hFE Test 10 200k VDDA E C B R30 100k ADP Diagram 32 PNP-type Triode |
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