| 전자부품 데이터시트 검색엔진 |
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FS9952_LP2 데이터시트(PDF) 30 Page - Fortune Semiconductor Corp. |
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FS9952_LP2 데이터시트(HTML) 30 Page - Fortune Semiconductor Corp. |
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30 / 34 page ![]() FS9952_LP2 Open-Short Test ONEK SMV AGND _ + RA 50k RB 1k R17 900k R19 1k PTC J8 J6 Rx VREF 0.4V FS9952 V/Ohm COM Diagram 30 Open-Short Test When doing the open-short test, the inner of IC will generate 0.4V voltage (relative to AGND) that is output from R19 and is added to open-short measuring point through PTC. J6 and J8 are mode switches that are close during doing the open-short test. Rx gets voltage VRx, and enters IC through R17. From the diagram we know that Rx=(R19+PTC)/50 So, the resistance value of PTC will influence the upper limit of open-short test resistance. When not connect to PTC, if R22 is 1kΩ, then the resistance of the buzzer sound is smaller than 30Ω. AC Large Current Clamp Meter Measurement Circuit 5 SA 30 AGND FS9952 RL VR R R29 100k Diagram 31 AC Large Current Measurement Triode hFE Test 10 200k VDDA E C B R30 100k ADP Diagram 32 PNP-type Triode Rev. 1.2 30/34 |
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