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ADRF5046BCCZN-R7 데이터시트(PDF) 14 Page - Analog Devices |
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ADRF5046BCCZN-R7 데이터시트(HTML) 14 Page - Analog Devices |
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14 / 15 page ![]() ADRF5046 Data Sheet Rev. 0 | Page 14 of 15 PROBE MATRIX BOARD The probe matrix board uses the same stackup as the evaluation board, but a different layout designed to perform measurements using GSG probes at close proximity to the RF pins. Probing eliminates the mismatch reflections caused by connectors, cables, and board layout. Therefore, the probe matrix board provides more accurate measurement of the device performance than the evaluation board. Figure 29 shows the top view of the probe matrix board layout. The probe matrix board includes a through reflect line (TRL) calibration kit allowing board loss de-embedding. The actual board duplicates the same layout in matrix form to assemble multiple devices at one time. All s parameters were measured on this board. Figure 29. Probe Matrix Board Layout (Top View) |
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