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CBM232AS16 데이터시트(PDF) 2 Page - COREBAI Microelectronics (Beijing) Co., Ltd.

부품명 CBM232AS16
상세설명  OPERATION INSTRUCTION
PDF  9 Pages
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제조업체  COREBAI [COREBAI Microelectronics (Beijing) Co., Ltd.]
홈페이지  http://www.corebai.com/en/
Logo COREBAI - COREBAI Microelectronics (Beijing) Co., Ltd.

CBM232AS16 데이터시트(HTML) 2 Page - COREBAI Microelectronics (Beijing) Co., Ltd.

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CBM232AS
OPERATION INSTRUCTION
Table of pin description
Pin No.
Symbol
Pin name
01
C1+
Output of external capacitance of positive voltage multiplier unit
02
V+
Output of positive voltage of multiplier unit
03
C1-
Output of external capacitance of positive voltage multiplier unit
04
C2+
Output of external capacitance of negative voltage multiplier unit
05
C2-
Output of external capacitance of negative voltage multiplier unit
06
V-
Output of negative voltage of multiplier unit
07
T2OUT
Output of transmitter data (levels RS– 232)
08
R2IN
Input of receiver data (levels RS – 232)
09
R2OUT
Output of receiver data (levels TTL/KMOS)
10
T2IN
Input of transmitter data (levels TTL/KMOS)
11
T1IN
Input of transmitter data (levels TTL/KMOS)
12
R1OUT
Output of receiver data (levels TTL/KMOS)
13
R1IN
Input of receiver data (levels RS – 232)
14
T1OUT
Output of transmitter data (levels RS – 232)
15
GND
Common output
16
VCC
Supply output of voltage source
Maximum conditions
Symbol
Parameter
Rate
Unit
Min
Max
VCC
Supply voltage
-0.3
6.0
V
V+
Transmitter high output voltage
VCC -0.3
14
V-
Transmitter low output voltage
-0.3
-14
VTIN
Transmitter input voltage
-0.3
V+ +0.3
VRIN
Receiver input voltage
-30
30
PD
Dissipated power
DIP – package
SO – package
mW
-
842
762
ISC
Output current of transmitter short circuit
-
Continu-ously
mA
Та
Ambient temperature
-60
150
℃
* Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device.
These are stress ratings only and functional operation of the device at these or any other conditions beyond
those indicated under “recommended operating conditions” is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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