MCP2561/2FD

DS20005284A-page 8

 2014 Microchip Technology Inc.

2.2

Absolute Maximum Ratings†

DC Voltage at CANH, CANL and SPLIT ...................................................................................................... -58V to +58V

Transient Voltage on CANH, CANL (ISO-7637) (See Figure 2-5)............................................................ -150V to +100V

Storage temperature ...............................................................................................................................-55°C to +150°C

Operating ambient temperature ..............................................................................................................-40°C to +150°C

Soldering temperature of leads (10 seconds) .......................................................................................................+300°C

ESD protection on CANH and CANL pins for MCP2561FD (IEC 61000-4-2) ........................................................±14 kV

ESD protection on CANH and CANL pins for MCP2562FD (IEC 61000-4-2) ..........................................................±8 kV

ESD protection on CANH and CANL pins (IEC 801; Human Body Model)..............................................................±8 kV

ESD protection on all other pins (IEC 801; Human Body Model).............................................................................±4 kV

ESD protection on all pins (IEC 801; Machine Model) ............................................................................................±300V

ESD protection on all pins (IEC 801; Charge Device Model)..................................................................................±750V

† NOTICE: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This

is a stress rating only and functional operation of the device at those or any other conditions above those indicated in

the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods

may affect device reliability.