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ASM2I99447 데이터시트(PDF) 8 Page - Alliance Semiconductor Corporation |
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ASM2I99447 데이터시트(HTML) 8 Page - Alliance Semiconductor Corporation |
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8 / 14 page ![]() May 2005 ASM2I99447 rev 0.3 3.3V/2.5V 1:9 LVCMOS Clock Fanout Buffer 8 of 14 Notice: The information in this document is subject to change without notice. CCLK QX VCC VCC ÷2 GND tP(LH) tP(HL) VCC VCC ÷2 GND Figure 6. Propagation Delay (tPD) Test Reference tSK(LH) tSK(HL) VCC VCC ÷2 GND VCC VCC ÷2 GND The pin-to-pin skew is defined as the worst case difference in propagation between any similar delay path within a single device Figure 7. Output–to–Output Skew tSK(LH, HL) CCLK QX VCC VCC ÷2 GND tP(LH) tP(HL) VCC VCC ÷2 GND tSK(P) =| tPHL - tPHL | Figure 8. Output Pulse Skew (tSK(P) Test VCC VCC ÷2 GND DC (tP ÷T0 Χ 100%) tP T0 The time from the output controlled edge to the non-controlled edge, divided by the time output controlled edge, expressed as a percentage. Figure 9. Output Duty Cycle (DC) tR VCC = 3.3V VCC = 2.5V 2.4 1.8V 0.5 0.6V tF Figure 10. Output Transition Time Test Reference TN TN + 1 TJIT(CC) = |TN -TN + 1| The variation in cycle time of a single between adjacent cycles, over a random sample of adjacent cycle pairs Figure 11. Cycle–to–Cycle Jitter Reference CCLK PCLK VCC VCC ÷2 GND tS VCC VCC ÷2 GND tH CLK_STOP Figure 12. Setup and Hold Time (tS, tH) Test Reference |
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