| 전자부품 데이터시트 검색엔진 |
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NFAQ0860L36T 데이터시트(PDF) 11 Page - ON Semiconductor |
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NFAQ0860L36T 데이터시트(HTML) 11 Page - ON Semiconductor |
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11 / 14 page ![]() NFAQ0860L36T www.onsemi.com 11 TEST CIRCUITS • ICES U+ V+ W+ U− V− W− A 38 38 38 32 26 20 B 32 26 20 17 18 19 U+, V+, W+ : High side phase U−, V−, W− : Low side phase Figure 16. Test Circuit for ICE A B 34 32 28 26 22 20 2,9,11,12 1,10,17,18,19 A VCE ICE VBS=15V VBS=15V VBS=15V VDD=15V • VCE(sat) (Test by pulse) U+ V+ W+ U− V− W− A 38 38 38 32 26 20 B 32 26 20 17 18 19 C 3 4 5 6 7 8 Figure 17. Test Circuit for VCE(SAT) A B 34 32 28 26 22 20 2,9,11,12 C V VCE(sat) IC VBS=15V VBS=15V VBS=15V VDD=15V 1,10,17,18,19 5V • VF (Test by pulse) U+ V+ W+ U− V− W− A 38 38 38 32 26 20 B 32 26 20 17 18 19 Figure 18. Test Circuit for VF A B V VF |
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