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FS32K112BHTXMLQTR 데이터시트(PDF) 58 Page - NXP Semiconductors |
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FS32K112BHTXMLQTR 데이터시트(HTML) 58 Page - NXP Semiconductors |
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58 / 100 page ![]() Table 41. 12-bit ADC characteristics (2.7 V to 3 V) (VREFH = VDDA, VREFL = VSS) 1 Symbol Description Min. Typ.2 Max. Unit Notes VDDA Supply voltage 2.7 — 3 V IDDA_ADC Supply current per ADC — 0.6 — mA 3 SMPLTS Sample Time 275 — Refer to the Reference Manual ns TUE4 Total unadjusted error — ±4 ±8 LSB5 6, 7, 8, 9 DNL Differential non-linearity — ±1.0 — LSB5 6, 7, 8, 9 INL Integral non-linearity — ±2.0 — LSB5 6, 7, 8, 9 1. This table is not applicable to S32K14xW. 2. Typical values assume VDDA = 3 V, Temp = 25 °C, fADCK = 40 MHz, RAS=20 Ω, and CAS=10 nF. 3. The ADC supply current depends on the ADC conversion rate. 4. Represents total static error, which includes offset and full scale error. 5. 1 LSB = (VREFH - VREFL)/2N 6. The specifications are with averaging and in standalone mode only. Performance may degrade depending upon device use case scenario. When using ADC averaging, refer to the Reference Manual to determine the most appropriate settings for AVGS. 7. For ADC signals adjacent to VDD/VSS or XTAL/EXTAL or high frequency switching pins, some degradation in the ADC performance may be observed. 8. All values guarantee the performance of the ADC for multiple ADC input channel pins. When using ADC to monitor the internal analog parameters, assume minor degradation. 9. All the parameters in the table are given assuming system clock as the clocking source for ADC. Table 42. 12-bit ADC characteristics (3 V to 5.5 V)(VREFH = VDDA, VREFL = VSS) Symbol Description Min. Typ.1 Max. Unit Notes S32K1xx S32K14xW S32K1xx/ S32K14xW S32K1xx/ S32K14xW VDDA Supply voltage 3 3.13 — 5.5 V IDDA_ADC Supply current per ADC — 1 — mA 2 SMPLTS Sample Time 275 — Refer to the Reference Manual ns TUE3 Total unadjusted error — ±4 ±8 LSB4 5, 6, 7, 8 DNL Differential non-linearity — ±0.7 — LSB4 5, 6, 7, 8 INL Integral non-linearity — ±1.0 — LSB4 5, 6, 7, 8 1. Typical values assume VDDA = 5.0 V, Temp = 25 °C, fADCK = 40 MHz, RAS=20 Ω, and CAS=10 nF unless otherwise stated. 2. The ADC supply current depends on the ADC conversion rate. 3. Represents total static error, which includes offset and full scale error. 4. 1 LSB = (VREFH - VREFL)/2N 5. The specifications are with averaging and in standalone mode only. Performance may degrade depending upon device use case scenario. When using ADC averaging, refer to the Reference Manual to determine the most appropriate settings for AVGS. 6. For ADC signals adjacent to VDD/VSS or XTAL/EXTAL or high frequency switching pins, some degradation in the ADC performance may be observed. 7. All values guarantee the performance of the ADC for multiple ADC input channel pins. When using ADC to monitor the internal analog parameters, assume minor degradation. 8. All the parameters in the table are given assuming system clock as the clocking source for ADC. ADC electrical specifications S32K1xx Data Sheet, Rev. 12, 02/2020 58 NXP Semiconductors |
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