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DRV8300DI 데이터시트(PDF) 21 Page - Texas Instruments |
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DRV8300DI 데이터시트(HTML) 21 Page - Texas Instruments |
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21 / 27 page ![]() 11 Layout 11.1 Layout Guidelines • Low ESR/ESL capacitors must be connected close to the device between GVDD and VSS pins and between BSTx and SHx pins to support high peak currents drawn from GVDD and BSTx pins during the turn-on of the external MOSFETs. • To prevent large voltage transients at the drain of the top MOSFET, a low ESR electrolytic capacitor and a good quality ceramic capacitor must be connected between the high side MOSFET drain and ground. • In order to avoid large negative transients on the switch node (SHx) pin, the parasitic inductances between the source of the high-side MOSFET and the source of the low-side MOSFET must be minimized. • In order to avoid unexpected transients, the parasitic inductance of the GHx, SHx, and GLx connections must be minimized. Minimize the length and number of vias wherever possible. Minimum10 mil trace is recommended. • Traces for GHx and SHx must be routed in parallel • Resistance between DT and GND must be place close to device 11.2 Layout Example GVDD Cap close to device DT resistance close to device BSTx and SHx cap close to device www.ti.com DRV8300 SLVSFG5 – SEPTEMBER 2020 Copyright © 2020 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: DRV8300 |
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