3)

If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage, V

CC

+200V

Bias Voltage, V

BB

+15V

Input Voltage, V

IN

-0.5V to V

Storage Temperature Range, T

STG

-65˚C to +150˚C

Lead Temperature (Soldering,

300˚C

ESD Tolerance

Machine Model

200V

Human Body Model

1.5 kV

Max Junction Temperature

150˚C

θ

70˚C

Limits of Operating Ranges (Note 3)

V

CC

130V to 180V

V

BB

7V to 13V

V

IN

1V to 5V

V

OUT

40V to 175V

Ambient Temperature Range, T

A

0˚C to 70˚C

DC Clamp Electrical Characteristics

(See Figure 2 for Test Circuit)

Unless otherwise noted: V

Symbol

Parameter

Conditions

Min

Typ

Max

Units

I

CC

Supply Current

All three channels, includes 100K

pull-up resistor current

4.5

7

mA

I

BB

Bias Supply Current

All channels

4

mA

V

OUT

DC Output Voltage

122

127

132

V

DC

V

OUT-Range

Output Voltage Range

V

89

V

A

V

DC Voltage Gain

−27

−30

−33

V/V

LE

Linearity Error

See Note 4

5

%

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.

Note 2: Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and

the test conditions, see the Electrical Characteristics. Datasheet min/max specification limits are guaranteed by design, test, or statistical analysis. The guaranteed

specifications apply only for the test conditions listed. Some performance characteristics may change when the device is not operated under the listed test

conditions.

Note 3: All voltages are measured with respect to GND, unless otherwise specified.

Test Circuit

Ω) is used for

DC measurements at the output.

20052934

FIGURE 2. Test Circuit

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