| 전자부품 데이터시트 검색엔진 |
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SWWVO112E 데이터시트(PDF) 9 Page - Seoul Semiconductor |
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SWWVO112E 데이터시트(HTML) 9 Page - Seoul Semiconductor |
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9 / 24 page ![]() R1.0 January 9, 2020 www.seoulsemicon.com Product Data Sheet SWWVO112E – WICOP 9 Reliability Test Item Reference Test Condition Duration / Cycle Number of Damage Room Temperature Operating Test - T a = 25℃, IF = 800mA 1,000 Hours 0/20 High Temperature Operating Test 1 - T a = 60℃, IF = 800mA 1,000 Hours 0/20 High Temperature Operating Test 2 - T a = 85℃, IF = 800mA 1,000 Hours 0/20 Wet High Temperature Operating Life(WHTOL) - Ta = 60℃, RH = 90% If = 800 mA 1,000hours 0/20 ESD Test - 2kV @ R1:10M Ω, R2:1.5KΩ, C:100pF 3 time 0/20 Table 3. TEST ITEMS AND RESULTS Table 4. Criteria for Judging the Damage Notes : *(1) I.V. : Initial Value Item Symbol Condition Criteria for Judgment MIN MAX Forward Voltage V F I F =800mA - I.V. *1 × 1.2 Luminous Flux ФV I F =800mA I.V. *1 × 0.7 - |
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