| 전자부품 데이터시트 검색엔진 |
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STSAFE-A110 데이터시트(PDF) 28 Page - STMicroelectronics |
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STSAFE-A110 데이터시트(HTML) 28 Page - STMicroelectronics |
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28 / 36 page ![]() Electrical characteristics STSAFE-A110 28/36 DS13039 Rev 1 5.4 AC characteristics Table 6. AC characteristics Name Description Min. Typ. Max. Units tR, tF Reset Reset rise and fall time - - 1 µs tWL Pulse width for Reset 1 - - µs Table 7. I²C operating conditions Name Description Standard mode Fast mode Units Min. Max. Min. Max. fSCL SCL frequency of sub-device: processor - 100 - 400 kHz tHD;STA Input low to Clock low (Start condition hold time) 4.0 - 0.6 - µs tLOW Low period of SCL clock 4.7 - 1.3 - µs tHIGH High period of SCL clock 4.0 - 0.6 - µs tSU;STA Clock high to Input Transition / Setup time for a (repeated) Start condition See Note 4.7 - 0.6 - µs tHD;DAT Clock low to Input transition 0(1) 1. The device must internally provide a hold time of at least 300 ns for the SDA signal in order to bridge the undefined region of the falling edge of SCL. (2) 2. The maximum tHD;DAT could be 3.45 µs and 0.9 µs for Standard mode and Fast mode, but must be less than the maximum of tVD;DAT or tVD;ACK by a transition time. This maximum must only be met if the device does not stretch the LOW period (tLOW) of the SCL signal. If the clock stretches the SCL signal, the data must be valid by the setup time before it releases the clock. 0(1) (2) µs tSU;DAT Input transition to Clock transition Data setup time 250 - 100 - ns tSU;STO Clock high to Input high (Stop) 4.0 - 0.6 - µs tBUF Input high to Input low (bus free between stop and start) 4.7 - 1.3 - µs tR Clock and Data rise time on load capacitance of 30 pF - 1000 20 300 ns tF Clock and Data fall time on load capacitance of 30 pF - 300 10 300 ns Table 8. I²C filter characteristics Symbol Parameter Min Max Unit tSP(1) 1. Guaranteed by design, not tested in production Pulse width of spikes that are suppressed by filter 0 50 ns |
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