ST8024CD datasheet(9/23 Pages) STMICROELECTRONICS

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ST8024

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Table 16: Card Presence Inputs (PINS PRES AND PRES)

(VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz, unless otherwise noted. Typical values are to Ta = 25°C) (Note

Table 17: Interrupt Output (PIN OFF NMOS Drain With Integrated 20 k

Ω PULL-UP Resistor To

VDD); (VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz, unless otherwise noted. Typical values are to Ta = 25°C)

Table 18: Protection And Limitation (VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz, unless otherwise noted.

Typical values are to Ta = 25°C)

Table 19: Timing (VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz, unless otherwise noted. Typical values

are to Ta = 25°C)

Note 1: All parameters remain within limits but are tested only statistically for the temperature range. When a parameter is specified as a

function of VDD or VCC it means their actual value at the moment of measurement.

Note 2: To meet these specifications, pin VCC should be decoupled to CGND using two ceramic multilayer capacitors of low ESR both with

values of 100 nF and 100 nF (see Fig.10).

Note 3: Permitted capacitor values are 100 + 100 nF, or 220 nF.

Note 4: Transition time and duty factor definitions are shown in Fig.3;

δ = t1/(t1+ t2).

Note 5: Pin CMDVCC is active LOW; pin RSTIN is active HIGH; for CLKDIV1 and CLKDIV2 functions see Table 20.

Note 6: Pin PRES is active LOW; pin PRES is active HIGH see Figs. 8 and 9; PRES has an integrated 1.25 µA current source to GND

(PRES to VDD); the card is considered present if at least one of the inputs PRES or PRES is active.

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

VIL

Input Voltage LOW

-0.3

0.3 VDD

VIH

Input Voltage HIGH

0.7 VDD

VDD+0.3

|ILIH|

Input Leakage Current HIGH VIH = VDD

5µA

|ILIL|

Input Leakage Current LOW

VIL = 0

µA

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

VOL

Low Level Output Voltage

IOL = 2 mA

0.3

VOH

High Level Output Voltage

IOH = -15 µA

0.75 VDD

RPU

Integrated pull-up resistor

20k

Ω Pull-up resistor to VDD

Ω

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

|ICC(SD)| Shutdown and limitation current pin

VCC

120

II/O(lim) limitation current pins I/O, AUX1 and

AUX2

-15

ICLK(lim) limitation current pin CLK

-70

IRST(lim) limitation current pin RST

-20

TSD

Shut down temperature

150

°C

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

tACT

Activation time

(See Fig. 5)

220

µs

tDE

Deactivation time

(See Fig. 7)

100

µs

Start of the window for sending CLK

to the card

(See Fig. 6)

130

µs

End of the window for sending CLK to

card

(See Fig. 6)

140

220

µs

tdebounce Debounce time pins PRES and PRES (See Fig. 8)

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