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MCP39F511N 데이터시트(PDF) 40 Page - Microchip Technology |
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MCP39F511N 데이터시트(HTML) 40 Page - Microchip Technology |
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40 / 61 page ![]() 2015-2018 Microchip Technology Inc. DS20005473B-page 40 MCP39F511N bit 5 OVERPOW_LA: Latching control of the Over Power event 1 = Event is latched and needs to be cleared 0 = Event is not latched (Default) bit 4 OVERCUR_LA: Latching control of the Over Current event 1 = Event is latched and needs to be cleared 0 = Event is not latched (Default) bit 3 VSUR_TST: Test control of the Voltage Surge event 1 = Simulated event is turned on 0 = Simulated event is turned off (Default) bit 2 VSAG_TST: Test control of the Voltage Sag event 1 = Simulated event is turned on 0 = Simulated event is turned off (Default) bit 1 OVERPOW_TST: Test control of the Over Power event 1 = Simulated event is turned on 0 = Simulated event is turned off (Default) bit 0 OVERCUR_TST: Test control of the Over Current event 1 = Simulated event is turned on 0 = Simulated event is turned off (Default) REGISTER 7-1: EVENT CONFIGURATION REGISTER (CONTINUED) |
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