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PDU17F 데이터시트(PDF) 5 Page - Data Delay Devices, Inc. |
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PDU17F 데이터시트(HTML) 5 Page - Data Delay Devices, Inc. |
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5 / 5 page ![]() PDU17F Doc #97005 DATA DELAY DEVICES, INC. 5 1/14/97 3 Mt. Prospect Ave. Clifton, NJ 07013 DELAY LINE AUTOMATED TESTING TEST CONDITIONS INPUT: OUTPUT: Ambient Temperature: 25 oC ± 3oC Load: 1 FAST-TTL Gate Supply Voltage (Vcc): 5.0V ± 0.1V Cload: 5pf ± 10% Input Pulse: High = 3.0V ± 0.1V Threshold: 1.5V (Rising & Falling) Low = 0.0V ± 0.1V Source Impedance: 50 Ω Max. Rise/Fall Time: 3.0 ns Max. (measured between 0.6V and 2.4V ) Pulse Width: PWIN = 1.5 x Total Delay Period: PERIN = 4.5 x Total Delay NOTE: The above conditions are for test only and do not in any way restrict the operation of the device. OUT OUT TRIG IN REF TRIG Test Setup DEVICE UNDER TEST (DUT) TIME INTERVAL COUNTER PULSE GENERATOR COMPUTER SYSTEM PRINTER IN Timing Diagram For Testing TDAR TDAF PERIN PWIN TRISE TFALL 0.6V 0.6V 1.5V 1.5V 2.4V 2.4V 1.5V 1.5V VIH VIL VOH VOL INPUT SIGNAL OUTPUT SIGNAL |
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