| 전자부품 데이터시트 검색엔진 |
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QLSP04WNL 데이터시트(PDF) 13 Page - Quelighting Corp |
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QLSP04WNL 데이터시트(HTML) 13 Page - Quelighting Corp |
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13 / 18 page ![]() 12 QLSP04WXL V1.0 ◼ Reliability test: No Item Condition Time/Cycle Sample size 1 Steady State Operating Life of Room Temperature 25℃ Operating 1000 Hrs 20 pcs 2 Steady State Operating Life of Low Temperature -40℃ -40℃ Operating 1000 Hrs 20 pcs 3 Steady State Operating Life of Low Temperature 60℃ 60℃ Operating 1000 Hrs 20 pcs 4 Steady State Operating Life of Low Temperature 85℃ 85℃ Operating 1000 Hrs 20 pcs 5 Low temperature storage -40℃ -40℃ Storage 1000 Hrs 20 pcs 6 High temperature storage 100℃ 100℃ Storage 1000 Hrs 20 pcs 7 Steady State Operating Life of High Humidity Heat 60℃90% 60oC/90% Operating 1000 Hrs 20 pcs 8 Steady State Pulse Operating Life Condition 25℃10Hz duty=1/10 Operating 200 Cycle 20 pcs 9 Resistance to soldering heat on PCB (JEDEC MSL3) pre-store@60℃, 60%RH for 52hrs Tsld max.=260 10sec 3 Times 20 pcs 10 Heat Cycle Test (JEDEC MRC) 25℃~65℃~-10℃, 90%RH, 24hr/1cycle 10 Cycle 20 pcs 11 Thermal shock -40℃/ 20minr~ 5minr~100℃ /20min 300 Cycle 20 pcs ◼ Judgment Criteria: Item Symbol Test Condition Judgment Criteria Forward Voltage Vf 200 mA △Vf< 10% Luminous Flux Iv 200 mA △Iv< 30% |
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