KAI-2001 datasheet(17/37 Pages) ONSEMI

부품명	KAI-2001

상세설명	1600 (H) x 1200 (V) Interline CCD Image Sensor

PDF	37 Pages

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제조업체	ONSEMI [ON Semiconductor]

홈페이지	http://www.onsemi.com

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KAI−2001

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DEFECT DEFINITIONS

Table 7. DEFECT DEFINITIONS

Description

Definition

Maximum

Temperature(s)

Tested at (

5C)

Notes

Major Dark Field Defective Pixel

Defect

≥ 179 mV

27, 40

Major Bright Field Defective Pixel

Defect

≥ 15%

27, 40

Minor Dark Field Defective Pixel

Defect

≥ 57 mV

200

27, 40

Cluster Defect

A group of 2 to 10 contiguous major

defective pixels, but no more than 2 adjacent

defects horizontally.

27, 40

Column Defect

A group of more than 10 contiguous major

defective pixels along a single column.

27, 40

1. There will be at least two non-defective pixels separating any two major defective pixels.

Defect Map

The defect map supplied with each sensor is based upon

testing at an ambient (27

°C) temperature. Minor point

defects are not included in the defect map. All defective

pixels are reference to pixel 1, 1 in the defect maps.

KAI-2001 데이터시트(PDF) 17 Page - ON Semiconductor