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TDA7562BEP 데이터시트(PDF) 17 Page - STMicroelectronics |
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TDA7562BEP 데이터시트(HTML) 17 Page - STMicroelectronics |
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17 / 34 page ![]() DocID028961 Rev 1 17/34 TDA7562BEP Diagnostics functional description 33 Figure 22. Restart timing without diagnostic enable (permanent) Each 1 ms time, a sampling of the fault is done Figure 23. Restart timing with diagnostic enable (permanent) 4.3 Output DC offset detection Any DC output offset exceeding ±2 V is signaled out. This inconvenience might occur as a consequence of initially defective or aged and worn-out input capacitors feeding a DC component to the inputs, so putting the speakers at risk of overheating. This diagnostic has to be performed with low-level output AC signal (or Vin = 0). The test is run with selectable time duration by microprocessor (from a "start" to a "stop" command): Start = Last reading operation or setting IB1 - D5 - (OFFSET enable) to 1 Stop = Actual reading operation Offset is signaled out if it lasts for the entire selected time duration. This feature is disabled if any overloads leading to activation of the short-circuit protection occur in the process. |
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