| 전자부품 데이터시트 검색엔진 |
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STELPD01APUR 데이터시트(PDF) 7 Page - STMicroelectronics |
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STELPD01APUR 데이터시트(HTML) 7 Page - STMicroelectronics |
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7 / 27 page ![]() Symbol Parameter Test conditions Min. Typ. Max. Unit Thermal protection TSHDN Thermal shutdown (3) 165 °C TSHDN_HYS Hysteresis 20 °C Current consumption IBIAS Bias current, device operational VIN = 5 V 300 µA VIN = 15 V 350 Bias current, fault mode VIN = 5 V 115 µA VIN = 15 V 135 Bias current, off mode VIN = 5 V, VEN/Fault = 0 V 200 µA VIN = 15 V, VEN/Fault = 0 V 225 1. Pulsed test. 2. Values across temperature range are guaranteed by design/correlation and tested in production only at ambient temperature. 3. Guaranteed by design, but not tested in production. STELPD01 Electrical characteristics DS13254 - Rev 1 page 7/27 |
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