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K4M561633G-RBL 데이터시트(PDF) 6 Page - Samsung semiconductor |
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K4M561633G-RBL 데이터시트(HTML) 6 Page - Samsung semiconductor |
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6 / 12 page ![]() K4M561633G - R(B)N/G/L/F January 2006 Mobile SDRAM AC OPERATING TEST CONDITIONS(VDD = 2.7V ∼ 3.6V, TA = -25 to 85°C for Extended, -25 to 70°C for Commercial) Parameter Value Unit AC input levels (Vih/Vil) 2.4 / 0.4 V Input timing measurement reference level 0.5 x VDDQ V Input rise and fall time tr/tf = 1/1 ns Output timing measurement reference level 0.5 x VDDQ V Output load condition See Figure 2 VDDQ 1200 Ω 870 Ω Output 30pF VOH (DC) = 2.4V, IOH = -2mA VOL (DC) = 0.4V, IOL = 2mA Vtt=0.5 x VDDQ 50 Ω Output 30pF Z0=50 Ω Figure 2. AC Output Load Circuit Figure 1. DC Output Load Circuit |
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