| 전자부품 데이터시트 검색엔진 |
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TC7SH34F 데이터시트(PDF) 2 Page - Toshiba Semiconductor |
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TC7SH34F 데이터시트(HTML) 2 Page - Toshiba Semiconductor |
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2 / 7 page ![]() TC7SH34F 2 4. 4. 4. 4. Marking and Pin Assignment Marking and Pin Assignment Marking and Pin Assignment Marking and Pin Assignment Marking Marking Marking Marking Pin Assignment (Top view) Pin Assignment (Top view) Pin Assignment (Top view) Pin Assignment (Top view) 5. 5. 5. 5. IEC Logic Symbol IEC Logic Symbol IEC Logic Symbol IEC Logic Symbol 6. 6. 6. 6. Truth Table Truth Table Truth Table Truth Table A L H Y L H 7. 7. 7. 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Supply voltage Input voltage DC output voltage Input diode current Output diode current DC output current VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Note (Note 1) Rating -0.5 to 7.0 -0.5 to 7.0 -0.5 to VCC + 0.5 -20 ±20 ±25 ±50 200 -65 to 150 Unit V mA mW Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: VOUT < GND, VOUT > VCC 2017-12-21 Rev.3.0 ©2015-2017 Toshiba Electronic Devices & Storage Corporation |
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