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MCP3465RT-E/SFX 데이터시트(PDF) 23 Page - Microchip Technology

부품명 MCP3465RT-E/SFX
상세설명  Two-Channel, 153.6 ksps, Low Noise 16-Bit Delta-Sigma ADC with Internal Voltage Reference
PDF  110 Pages
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제조업체  MICROCHIP [Microchip Technology]
홈페이지  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP3465RT-E/SFX 데이터시트(HTML) 23 Page - Microchip Technology

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DS20006414C-page 23
MCP3465R
2.1
Noise Specifications
Table 2-1 and Table 2-2 summarize the noise
performance of the MCP3465R device. The noise per-
formance is an analog gain function of the ADC (digital
gain does not change the noise performance
significantly) and the OSR, chosen through the user
interface. With a higher gain, the input referred noise is
reduced. With a higher OSR setting, the noise is also
reduced, as the oversampling diminishes both thermal
noise and the quantization noise induced by the
Delta-Sigma modulator loop.
The noise value generally increases when temperature
is higher as thermal noise is dominant for all OSR
larger than 32. For high OSR settings (> 512), the
thermal noise is largely dominant and increases
proportionally to the square root of the absolute
temperature. The performance in Table 2-1 to
Table 2-4 has been measured with the device placed in
Continuous Conversion mode, with the differential
input voltage equal to VIN = 0V, default conditions for
the register map and MCLK = 4.9152 MHz.
The noise performance is also a function of the
measurement duration. For short duration measure-
ments (low number of consecutive samples), the
peak-to-peak noise is usually reduced, because the crest
factor (ratio between the RMS noise and peak-to-peak
noise) is reduced. This is a consequence of the noise
distribution being Gaussian by nature (see Figure 2-5 for
noise histogram example and fitting with an ideal
Gaussian distribution). The noise specifications have
been measured with a sample size of 16384 samples for
low OSR values and have been capped to approximately
80 seconds for the 16384 samples, leading to a larger
duration. The noise specifications are expressed in two
different values, which lead to the same quantity. It is
more practical to choose one of these representations
depending on the desired application.
In Table 2-1, the RMS (Root Mean Square) noise is the
variance of the ADC output code, expressed in µVRMS
and the input referred to with Equation 5-5. The
peak-to-peak noise values are in parentheses. The
peak-to-peak noise is the difference between the
maximum and minimum code observed during the
complete time of the measurement (see Equation 5-5).
In Table 2-2, the noise is expressed in Effective
Resolution (ER). The Effective Resolution is a ratio of
the full-scale range of the ADC (that depends on VREF
and gain) and the noise performance of the device. The
Effective Resolution can be determined from the RMS
or
peak-to-peak
noise
with
Equation 2-1
and
Equation 2-2.
EQUATION 2-1:
EQUATION 2-2:
Due to the nature of the noise, the performance
detailed in the noise tables can vary significantly from
one measurement to another. They present an averag-
ing of the performance over a large distribution of parts
over multiple lots. They give the typical expectation of
the noise performance, but performance can be better
or worse if a limited number of measurements is per-
formed. For large gain and OSR combinations, if the
noise performance is comparable to the quantization
step (1 LSb), the performance is limited to 0.5 LSb for
the RMS noise and 1 LSb for the peak-to-peak noise
(same limits for Effective Resolution values).
These figures correspond to the resolution limit of the
device, as peak-to-peak noise cannot be better than
1 LSb. Similarly, if the intrinsic RMS noise of the device
is much smaller than 0.5 LSb, it can lead to histogram
with either one or two bins, depending on the relative
position of the input voltage versus the possible
quantized outputs of the ADC. If the position is exactly
in between two quantization steps, the histogram of
output noise will have two bins with exactly 50% occur-
rence on each. This case gives an RMS noise of a
0.5 LSb value, which is therefore, used as a cap of the
performance for the sake of clarity and a better
representation on the noise tables.
The noise specifications are improved by a ratio of
approximately √2 (or 0.5-bit Effective Resolution) when
the AZ_MUX setting is enabled. However, the output
data rate is significantly reduced (see Figure 5-5 and
Table 5-6).
The digital gain added for Gain = 32x and 64x settings
is not significant for the noise performance, therefore
the noise values can be extracted from the Gain = 16x
columns.
Effective
Resolution
performance
is
degraded by 1 bit for Gain = 32x and 2 bits for Gain =
64x, compared to Gain = 16x performance.
Note:
All Output Noise performance-related
tables and figures are with reference to
the input (i.e., Input Referred).
ERRMS
2VREF
GAIN RMS (Noise)
-----------------------------------------------------


ln
2

ln
----------------------------------------------------------------
=
ERpk pk
–
2VREF
GAIN Peak-to-Peak Noise
----------------------------------------------------------------------


ln
2

ln
---------------------------------------------------------------------------------
=



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