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74F323 데이터시트(PDF) 5 Page - NXP Semiconductors |
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74F323 데이터시트(HTML) 5 Page - NXP Semiconductors |
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5 / 7 page ![]() Philips Semiconductors Product specification 74F323 8-bit universal shift/storage register with synchronous reset and common I/O pins (3-State) 1990 Mar 01 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VOH High-level output voltage Q0, Q7 VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±10%VCC 2.5 V VOH High-level output voltage Q0, Q7 VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±5%VCC 2.7 3.4 V VOH High-level output voltage I/On VIL = MAX, VIH = MIN IOH = –3mA ±10%VCC 2.5 V I/On VIH = MIN IOH = –3mA ±5%VCC 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage others VCC = MAX, VI = 7.0V 100 µA II Input current at maximum input voltage I/On VCC = 5.5V, VI = 5.5V 1 mA IIH High-level input current except I/On VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current S0, S1 VCC = MAX, VI = 0.5V –1.2 mA IIL Low-level input current others VCC = MAX, VI = 0.5V –0.6 mA IIH + IOZH Off-state output current, High-level voltage applied I/On only VCC = MAX, VO = 2.7V 70 µA IIL + IOZL Off-state output current Low-level voltage applied only VCC = MAX, VO = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICCH VCC = MAX 55 75 mA ICC Supply current (total) ICCL VCC = MAX 65 90 mA ICCZ CC = MAX 55 85 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb =+ 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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