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74F366 데이터시트(PDF) 6 Page - NXP Semiconductors

부품명 74F366
상세설명  Buffers/drivers
PDF  10 Pages
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제조업체  PHILIPS [NXP Semiconductors]
홈페이지  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F366 데이터시트(HTML) 6 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F365, 74F366*
74F367, 74F368*
Buffers/drivers
1999 Jan 08
6
* Discontinued part. Please see the Discontinued Products List.
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
NO TAG
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
VCC = MIN, VIL = MAX,
"10%VCC
2.4
V
VO
High level output voltage
VCC
MIN, VIL
MAX,
VIH = MIN, IOH = –3mA
"5%VCC
2.7
3.3
V
VOH
High-level output voltage
VCC = MIN, VIL = MAX,
"10%VCC
2.0
V
VCC
MIN, VIL
MAX,
VIH = MIN, IOH = –15mA
"5%VCC
2.0
V
VO
Low level output voltage
VCC = MIN, VIL = MAX,
"10%VCC
0.55
V
VOL
Low-level output voltage
VCC = MIN, VIL
MAX,
VIH = MIN, IOL = MAX
"5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
µA
IOZH
Off-state output current,
High-level voltage applied
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short-circuit output currentNO TAG
VCC = MAX
–100
–225
mA
ICCH
25
35
mA
74F365
74F367
ICCL
VCC = MAX
47
62
mA
ICC
Supply current (total)
74F367
ICCZ
35
48
mA
ICC
Supply current (total)
ICCH
18
25
mA
74F366
74F368
ICCL
VCC = MAX
47
62
mA
74F368
ICCZ
35
48
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
TA = +25°C
TA = -55°C to +125°C
SYMBOL
PARAMETER
TEST
CONDITIONS
VCC = +5.0V
VCC = +5.0V ± 10%
UNIT
CONDITIONS
CL = 50pF, RL = 500Ω
CL = 50pF, RL = 500Ω
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
74F366,
74F368
Waveform 1
3.0
2.0
5.0
3.0
6.5
5.0
3.0
1.5
7.5
5.5
ns
ns
tPLH
tPHL
Propagation delay
In to Yn
74F365,
74F367
Waveform 2
2.5
2.5
4.5
5.5
6.5
7.0
2.0
2.0
7.0
7.5
ns
ns
tPZH
tPZL
Output Enable time
to High or Low level
74F365,
74F366
Waveform 3
Waveform 4
2.5
2.5
4.0
5.0
6.5
8.0
2.5
2.5
7.5
8.5
ns
ns
tPZH
tPZL
Output Enable time
to High or Low level
74F367,
74F368
Waveform 3
Waveform 4
3.0
3.0
5.5
6.5
7.5
8.5
3.0
3.0
8.5
9.0
ns
ns
tPHZ
tPLZ
Output Disable time
from High to Low level
Waveform 3
Waveform 4
2.0
2.0
4.5
4.0
6.5
6.5
2.0
2.0
7.0
7.0
ns
ns



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